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탁상형 전자현미경 (Tabletop microscope + EDX)

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뷰페이지
사용용도
표준분류 광학/전자 영상장비
모델명 TM3030
제작사 다다코리아
구축일자 2015. 12. 08
보유기관 한국원자력연구원 첨단방사선연구소
장비설명 기존의 전자현미경과는 달리 시료 전처리 없이 이미지를 얻고 성분 분석할 수 있는 시스템으로 (charge-up reduction mode 탑재), 다양한 시료의 이미지 분석 뿐만 아니라 EDX를 이용한 시료의 원소분석이 가능함
구성 및 성능 Main unitpumping systemstandard accessoryoptional accessory (EDX)1) Small tabletop microscope- The TM3030 is a tabletop microscope that represents a significantreduction in size and weight over the previous SEMs. Similar to an optical microscope,the TM3030 can be used by setting it on a table.2) Permits observation of high-magnification images with a larger focal depththan attainable with an optical microscope.- Compared with images produced by an optical microscope, the TM3030 delivershigh-magnification images with a large focal depth, a characteristic of the SEM.3) Elimination of preparationThe low-vacuum style of operation eliminates the need for cumbersome preparation,such as providing a metal coating on the specimen for the prevention of charge-up.Specimens can be set “as is” for ready observation and EDX analysis.4) Prevention of insulation specimen charge-up through the use of a charge-up reduction mode.- Specimens containing insulation materials can be observed while preventingcharg
사용예 전자현미경 이미지 촬영 (~6만배)가속전압:5, 15 keVEDX 측정가능Energy Dispersive X-Ray Spectrometer1setOxford Model SwiftED3000 Microanalysis SystemConsist of :1) Analytical Drift Detector (ADD)- 20,000cps- Active Area : 20 sqmmSilicon Drift Chamber Crystal- Collimator assembly to minimize stray peaks incorporating electron trap- WD=10mm- TOA 25 deg(min)- Vacuum sensor which shuts-off the detector when chamber is vented- Liquid nitrogen free cooling using thermoelectric (Peltier) cooling- No external compressor, gas lines or chiller- Thermally cyclable ? detector only needs to be cooled when required- Detector cools automatically when SEM column is pumped Detector cools down inminutes.2) Software Features- EDS Spectrum View provides Spectrum Collection, Qualitative and Quantitative Analysis- Image View provides Digital Image Collection- Point & ID - Image centric analysis- Map view collects and displays X-ray maps- Line Scan View collects and displays X-ray line scans